Conferencistas Internacionais

Step-Stress Reliability Models and Associated Inference and Designs

Prof. N. Balakrishnan (McMaster University-Canada)

In this talk, I will introduce first various models that are used in the context of step-stress testing. Then, I will describe the cumulative exposure model in detail and describe the model under the assumption of exponentiality. I will then discuss the derivation of the MLEs and their exact conditional distributions, and then present various methods of inference including exact, asymptotic and bootstrap methods and compare their performances. I will develop the results for different forms of censored data, and then present some illustrative examples. Finally, I will point out some open problems in this direction.